君临国际

    PT-306
    6 inch semi-automatic probe station
    Matched with DC probe holders for test, and support installation of 6 probe holders
    High-precision CCD vision positioning system with great automation
    Optional high-temperature and high voltage test modules, to meet more product test requirements
    Optional shading test
    Test application

    Suitable for wafer testing of integrated circuits and power devices of 6 inch and below

    Main functions
    Automatic dotting
    Automatic wafer alignment
    Automatic probe cleaning
    Real-time MAP display and product storage
    Test application
    High-pressure test
    High current test
    High-temperature test
    Re-measurement of an NG point
    Shading test
    Consultation/Complaint
    Question Type
    Name
    Phone
    Telephone
    Email
    Gender
    male
    female
    Company Name
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    Content
    0755-28938875